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   <dc:title>Validation of optical codes based on 3D nanostructures</dc:title>
   <dc:creator>Carnicer González, Arturo</dc:creator>
   <dc:creator>Javidi, Bahram</dc:creator>
   <dc:subject>Seguretat informàtica</dc:subject>
   <dc:subject>Visualització tridimensional</dc:subject>
   <dc:subject>Xifratge (Informàtica)</dc:subject>
   <dc:subject>Processament òptic de dades</dc:subject>
   <dc:subject>Computer security</dc:subject>
   <dc:subject>Three-dimensional display systems</dc:subject>
   <dc:subject>Data encryption (Computer science)</dc:subject>
   <dc:subject>Optical data processing</dc:subject>
   <dcterms:abstract>Image information encoding using random phase masks produce speckle-like noise distributions when the sample is propagated in the Fresnel domain. As a result, information cannot be accessed by simple visual inspection. Phase masks can be easily implemented in practice by attaching cello-tape to the plain-text message. Conventional 2D-phase masks can be generalized to 3D by combining glass and diffusers resulting in a more complex, physical unclonable function. In this communication, we model the behavior of a 3D phase mask using a simple approach: light is propagated trough glass using the angular spectrum of plane waves whereas the diffusor is described as a random phase mask and a blurring effect on the amplitude of the propagated wave. Using different designs for the 3D phase mask and multiple samples, we demonstrate that classification is possible using the k-nearest neighbors and random forests machine learning algorithms.</dcterms:abstract>
   <dcterms:issued>2017-12-20T16:21:15Z</dcterms:issued>
   <dcterms:issued>2017-12-20T16:21:15Z</dcterms:issued>
   <dcterms:issued>2017-05-10</dcterms:issued>
   <dcterms:issued>2017-12-20T16:21:15Z</dcterms:issued>
   <dc:type>info:eu-repo/semantics/article</dc:type>
   <dc:type>info:eu-repo/semantics/publishedVersion</dc:type>
   <dc:relation>Reproducció del document publicat a: https://doi.org/10.1117/12.2262417</dc:relation>
   <dc:relation>Proceedings of SPIE, 2017, vol. 10219, p. 102190M-1-102190M-6</dc:relation>
   <dc:relation>https://doi.org/10.1117/12.2262417</dc:relation>
   <dc:rights>(c) Society of Photo-Optical Instrumentation Engineers (SPIE), 2017</dc:rights>
   <dc:rights>info:eu-repo/semantics/openAccess</dc:rights>
   <dc:publisher>Society of Photo-Optical Instrumentation Engineers (SPIE)</dc:publisher>
   <dc:source>Articles publicats en revistes (Física Aplicada)</dc:source>
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