2026-04-13T02:35:21Zhttps://recercat.cat/oai/request

oai:recercat.cat:2117/873742026-01-30T09:18:36Zcom_2072_1033col_2072_452950

Requirements for noise parameter measurements in superconducting electronic systems O'Callaghan Castellà, Juan Manuel Àrees temàtiques de la UPC::Enginyeria de la telecomunicació Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica Noise--Measurement Electric noise measurement Microwave measurement Solid-state microwave devices Superconducting junction devices Soroll--Mesurament General considerations on the measurement of noise parameters in highly mismatched systems are discussed. In particular, the problem of noise characterization of active superconducting microwave devices is addressed. A measurement technique that includes an error analysis is presented along with current data for a superconducting flux flow transistor. Peer Reviewed Postprint (published version) 1991 Conference report http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=146971 Open Access Institute of Electrical and Electronics Engineers (IEEE)