2026-04-14T05:06:39Zhttps://recercat.cat/oai/request

oai:recercat.cat:2117/863122026-01-16T09:24:48Zcom_2072_1033col_2072_452950

FET noise-parameter determination using a novel technique based on 50 noise measurements Lázaro Guillén, Antoni Pradell i Cara, Lluís O'Callaghan Castellà, Juan Manuel Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions Universitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones Àrees temàtiques de la UPC::Enginyeria electrònica Hearing Acoustic reflection Calibration Oïda A novel method for measuring the four noise parameters of a field-effect transistor (FET) is presented. It is based on the determination of its intrinsic noise matrix elements [CINT 11 , CINT 22 , Re(CINT 12 ), Im(CINT 12 )] by fitting the measured device noise figure for a matched source reflection coefficient (F50) at a number of frequency points, thus, a tuner is not required. In contrast to previous works, no restrictive assumptions are made on the intrinsic noise sources. The receiver full-noise calibration is easily performed by using a set of coaxial and on-wafer standards that are commonly available in a microwave laboratory, thus, an expensive broad-band tuner is not required for calibration either. On-wafer experimental verification up to 26 GHz is presented and a comparison with other F50-based and tunerbased methods is given. As an application, the dependence of the FET intrinsic noise sources as a function of the bias drain–current and gate–length is obtained. Peer Reviewed Postprint (published version) 1999-03 Article Lazaro, A., Pradell, L., O'callaghan, J. FET noise-parameter determination using a novel technique based on 50 noise measurements. "IEEE transactions on microwave theory and techniques", Març 1999, vol. 47, núm. 3, p. 315-324. 0018-9480 https://hdl.handle.net/2117/86312 10.1109/22.750233 eng http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=750233 Open Access 10 p. application/pdf IEEE Microwave Theory and Techniques Society