<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-04-13T02:50:40Z</responseDate><request verb="GetRecord" identifier="oai:www.recercat.cat:2117/85310" metadataPrefix="oai_dc">https://recercat.cat/oai/request</request><GetRecord><record><header><identifier>oai:recercat.cat:2117/85310</identifier><datestamp>2025-07-17T05:14:41Z</datestamp><setSpec>com_2072_1033</setSpec><setSpec>col_2072_452950</setSpec></header><metadata><oai_dc:dc xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
   <dc:title>Radiated transient interferences measurement procedure to evaluate digital communication systems</dc:title>
   <dc:creator>Pous Solà, Marc</dc:creator>
   <dc:creator>Azpúrua Auyanet, Marco Aurelio</dc:creator>
   <dc:creator>Silva Martínez, Fernando</dc:creator>
   <dc:contributor>Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica</dc:contributor>
   <dc:contributor>Universitat Politècnica de Catalunya. Departament d'Enginyeria Elèctrica</dc:contributor>
   <dc:contributor>Universitat Politècnica de Catalunya. IEB - Instrumentació Electrònica i Biomèdica</dc:contributor>
   <dc:subject>Àrees temàtiques de la UPC::Enginyeria electrònica</dc:subject>
   <dc:subject>Electromagnetic interference</dc:subject>
   <dc:subject>APD</dc:subject>
   <dc:subject>transient interferences</dc:subject>
   <dc:subject>impulsive noise</dc:subject>
   <dc:subject>radiated emissions</dc:subject>
   <dc:subject>time-domain measurement</dc:subject>
   <dc:subject>Interferència electromagnètica</dc:subject>
   <dc:description>In this paper, a measurement procedure to capture properly the electromagnetic fields generated by radiated transient interferences is described. Measuring this type of impulsive noise out of the measurements defined at the EMC standards is essential to acquire the main parameters of the&#xd;
interferences. In order to protect the digital communication systems against radiated transients, the essential measurement requirements, considering the transient characteristics and the communication system parameters, have been established. To accomplish with the requirements, a time-domain measuring&#xd;
procedure combining the sensitivity input stage of an EMI receiver and the capabilities of the oscilloscope for event detection and storage is developed. Moreover, a final postprocessing stage has been also defined to obtain the in-phase and quadrature components of the interference as well as the capability to find the APD diagram, which is a powerful tool to analyse the degradation produced to a communication system.&#xd;
Finally, a measurement of radiated transients considering the impact over a RFID system is performed to illustrate the results that can be achieved employing the developed methodology.</dc:description>
   <dc:description>Postprint (published version)</dc:description>
   <dc:date>2015</dc:date>
   <dc:type>Conference report</dc:type>
   <dc:identifier>Pous, M., Azpúrua, M., Silva, F. Radiated transient interferences measurement procedure to evaluate digital communication systems. A: International Symposium on Electromagnetic Compatibility. "IEEE International Symposium on Electromagnetic Compatibility (EMC), 2015: [joint conference with] EMC Europe; 16-22 Aug. 2015, Dresden". Dresden: Institute of Electrical and Electronics Engineers (IEEE), 2015, p. 456-461.</dc:identifier>
   <dc:identifier>978-1-4799-6617-2</dc:identifier>
   <dc:identifier>https://hdl.handle.net/2117/85310</dc:identifier>
   <dc:language>eng</dc:language>
   <dc:relation>http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7256205&amp;filter%3DAND%28p_IS_Number%3A7256113%29%26pageNumber%3D4</dc:relation>
   <dc:rights>http://creativecommons.org/licenses/by-nc-nd/3.0/es/</dc:rights>
   <dc:rights>Restricted access - publisher's policy</dc:rights>
   <dc:format>6 p.</dc:format>
   <dc:format>application/pdf</dc:format>
   <dc:publisher>Institute of Electrical and Electronics Engineers (IEEE)</dc:publisher>
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