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oai:recercat.cat:2117/815602026-02-04T06:36:53Zcom_2072_1033col_2072_452950

Memristive crossbar design and test in non-adaptive proactive reconfiguring scheme Pouyan, Peyman Amat, Esteve Rubio Sola, Jose Antonio Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Circuits integrats Àrees temàtiques de la UPC::Informàtica::Arquitectura de computadors Integrated circuits Computer architecture Crossbar RRAM Emerging device Memristor Proactive reconfiguration Process variability Reliability Test Circuits integrats Arquitectura d'ordinadors One of the most promising emerging technologies is based on the use of memristive devices. Although capable of implementing certain type of logic circuits, they are being extensively used for memory applications. Beside memristor advantages such as high scalability, their drawbacks including manufacturing process variability and limited read/write endurance, could risk their future utilization. In this work we propose an implementation of a proactive reconfiguration strategy alongside a testing procedure to detect the weakest memory cells inside the crossbar. Such a realization can extend the crossbar lifetime. Peer Reviewed Postprint (published version) 2015 Conference report Pouyan, P., Amat, E., Rubio, A. Memristive crossbar design and test in non-adaptive proactive reconfiguring scheme. A: European Conference on Circuit Theory and Design. "2015 European Conference on Circuit Theory and Design (ECCTD): August 24-26, 2015: Trondheim, Norway". Trondheim: Institute of Electrical and Electronics Engineers (IEEE), 2015. 978-1-4799-9877-7 https://hdl.handle.net/2117/81560 10.1109/ECCTD.2015.7300125 eng http://ieeexplore.ieee.org/search/searchresult.jsp?queryText=ECCTD%202015%20rubio&newsearch=true http://creativecommons.org/licenses/by-nc-nd/3.0/es/ Restricted access - publisher's policy application/pdf Institute of Electrical and Electronics Engineers (IEEE)