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QoS-Enabled distributed access on optical burst-switched networks Triay Marquès, Joan Zervas, Georgios Cervelló Pastor, Cristina Nejabati, Reza Simeonidou, Dimitra Universitat Politècnica de Catalunya. Departament d'Enginyeria Telemàtica Universitat Politècnica de Catalunya. BAMPLA - Disseny i Avaluació de Xarxes i Serveis de Banda Ampla Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Telemàtica i xarxes d'ordinadors Optical networks Xarxes de telecomunicacions òptiques Optical Burst Switching (OBS) has been proposed as an efficient technology to cope with the ever increasing bursty traffic on the Internet. The emergence of a broad range of network-driven applications (e.g. multimedia, online gaming)introduces the need for a network environment able to provide service with different Quality of Service (QoS) guarantees. Burst loss probability, as one of the main QoS metrics on bufferless OBS networks, plays a considerable role on providing a network service with a particular level of QoS. In this paper, a novel MAC based protocol is proposed to support multiple QoS levels on OBS networks without wavelength conversion. It has been evaluated through extensive simulations and its simplistic form makes it very promising. Results indicate that the protocol can clearly provide a relative differentiation of services and guarantee null (or negligible) burst loss probability for a wide network (or offered) load range and, finally, low access delay for the highest priority traffic. Peer Reviewed Postprint (published version) 2010-01 Conference lecture Triay, J. [et al.]. QoS-Enabled distributed access on optical burst-switched networks. A: IFIP TC6 Working Conference on Optical Network Design and Modeling. "14th Conference on Optical Network Design and Modeling". Kyoto: IEEE Press. Institute of Electrical and Electronics Engineers, 2010, p. 1-6. 978-3-901882-41-8 https://hdl.handle.net/2117/6689 International Federation for Information Processing (IFIP) eng http://www-mura.ist.osaka-u.ac.jp/ondm2010/ Open Access 6 p. application/pdf IEEE Press. Institute of Electrical and Electronics Engineers