<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-04-17T21:36:21Z</responseDate><request verb="GetRecord" identifier="oai:www.recercat.cat:2117/448626" metadataPrefix="oai_dc">https://recercat.cat/oai/request</request><GetRecord><record><header><identifier>oai:recercat.cat:2117/448626</identifier><datestamp>2026-02-04T04:02:18Z</datestamp><setSpec>com_2072_1033</setSpec><setSpec>col_2072_452950</setSpec></header><metadata><oai_dc:dc xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
   <dc:title>A new approach to evaluating aging in passive networks of traction inverters via impedance variation</dc:title>
   <dc:creator>Pérez Farré, Quirc</dc:creator>
   <dc:creator>Gómez Rivera, Luis Felipe</dc:creator>
   <dc:creator>López Torres, Carlos</dc:creator>
   <dc:creator>García Espinosa, Antonio</dc:creator>
   <dc:creator>Paredes Camacho, Alejandro</dc:creator>
   <dc:contributor>Universitat Politècnica de Catalunya. Doctorat en Enginyeria Elèctrica</dc:contributor>
   <dc:contributor>Universitat Politècnica de Catalunya. Doctorat en Enginyeria Electrònica</dc:contributor>
   <dc:contributor>Universitat Politècnica de Catalunya. Departament d'Enginyeria Elèctrica</dc:contributor>
   <dc:contributor>Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica</dc:contributor>
   <dc:contributor>Universitat Politècnica de Catalunya. MCIA - Motion Control and Industrial Applications Research Group</dc:contributor>
   <dc:subject>Àrees temàtiques de la UPC::Enginyeria elèctrica</dc:subject>
   <dc:subject>Passive networks</dc:subject>
   <dc:subject>Impedance measurement</dc:subject>
   <dc:subject>Capacitors</dc:subject>
   <dc:subject>Electromagnetic interference</dc:subject>
   <dc:subject>Switches</dc:subject>
   <dc:subject>Aging</dc:subject>
   <dc:subject>Inverters</dc:subject>
   <dc:subject>Frequency measurement</dc:subject>
   <dc:subject>Impedance</dc:subject>
   <dc:subject>Testing</dc:subject>
   <dc:description>“© 2025 IEEE.  Personal use of this material is permitted.  Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.”</dc:description>
   <dc:description>Ensuring electromagnetic compatibility in electric vehicles is crucial, along with minimizing DC bus voltage ripple caused by inverter switching to maintain system stability and performance. The circuit consisting of the electromagnetic interference filter and the DC-link capacitor is a passive network that represents one of the most critical systems of the inverter in terms of reliability. This paper presents a novel method for the characterization of DC-link capacitor aging and detection of electromagnetic interference filter degradation using impedance response analysis. This method enables distinguishing between the aging of the electromagnetic interference filter and the DC-link capacitor through a single measurement, without the need to open the inverter, requiring access only to the high-voltage DC terminals.</dc:description>
   <dc:description>Postprint (published version)</dc:description>
   <dc:date>2025</dc:date>
   <dc:type>Conference lecture</dc:type>
   <dc:identifier>Perez, Q. [et al.]. A new approach to evaluating aging in passive networks of traction inverters via impedance variation. A: Annual Conference of the IEEE Industrial Electronics Society. «IECON 2025: 51st Annual Conference of the IEEE Industrial Electronics Society». Institute of Electrical and Electronics Engineers (IEEE), 2025, p. 1-7. ISBN 979-8-3315-9681-1. DOI 10.1109/IECON58223.2025.11221419 .</dc:identifier>
   <dc:identifier>979-8-3315-9681-1</dc:identifier>
   <dc:identifier>https://hdl.handle.net/2117/448626</dc:identifier>
   <dc:identifier>10.1109/IECON58223.2025.11221419</dc:identifier>
   <dc:language>eng</dc:language>
   <dc:relation>https://ieeexplore.ieee.org/document/11221419</dc:relation>
   <dc:rights>Open Access</dc:rights>
   <dc:format>7 p.</dc:format>
   <dc:format>application/pdf</dc:format>
   <dc:publisher>Institute of Electrical and Electronics Engineers (IEEE)</dc:publisher>
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