<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-04-05T12:43:49Z</responseDate><request verb="GetRecord" identifier="oai:www.recercat.cat:2117/20802" metadataPrefix="didl">https://recercat.cat/oai/request</request><GetRecord><record><header><identifier>oai:recercat.cat:2117/20802</identifier><datestamp>2025-07-17T04:28:18Z</datestamp><setSpec>com_2072_1033</setSpec><setSpec>col_2072_452950</setSpec></header><metadata><d:DIDL xmlns:d="urn:mpeg:mpeg21:2002:02-DIDL-NS" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="urn:mpeg:mpeg21:2002:02-DIDL-NS http://standards.iso.org/ittf/PubliclyAvailableStandards/MPEG-21_schema_files/did/didl.xsd">
   <d:Item id="hdl_2117_20802">
      <d:Descriptor>
         <d:Statement mimeType="application/xml; charset=utf-8">
            <dii:Identifier xmlns:dii="urn:mpeg:mpeg21:2002:01-DII-NS" xsi:schemaLocation="urn:mpeg:mpeg21:2002:01-DII-NS http://standards.iso.org/ittf/PubliclyAvailableStandards/MPEG-21_schema_files/dii/dii.xsd">urn:hdl:2117/20802</dii:Identifier>
         </d:Statement>
      </d:Descriptor>
      <d:Descriptor>
         <d:Statement mimeType="application/xml; charset=utf-8">
            <oai_dc:dc xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
               <dc:title>Evaluation of operational amplifier immunity by means of Weibull distribution</dc:title>
               <dc:creator>Fernández García, Raúl</dc:creator>
               <dc:creator>Gil Galí, Ignacio</dc:creator>
               <dc:subject>Audio Amplifiers</dc:subject>
               <dc:subject>Power amplifiers</dc:subject>
               <dc:subject>Radio frequency</dc:subject>
               <dc:subject>Operational amplifier</dc:subject>
               <dc:subject>Weibull distribution</dc:subject>
               <dc:subject>electromagnetic interference</dc:subject>
               <dc:subject>Ràdio--Freqüència modulada</dc:subject>
               <dc:subject>Amplificadors de potència</dc:subject>
               <dc:subject>Radiofreqüència</dc:subject>
               <dc:subject>Weibull distribution</dc:subject>
               <dc:subject>immunity testing</dc:subject>
               <dc:subject>operational amplifiers</dc:subject>
               <dc:subject>radiofrequency interference</dc:subject>
               <dc:description>The immunity of operational amplifiers is a trend &#xd;
topic for electromagnetic compatibility EMC community. &#xd;
Radiofrequency interference is usually applied to the operation &#xd;
amplifier and the voltage offset is monitored as a parameter to &#xd;
evaluate the EMC degradation. However, this method does not &#xd;
provide enough information to know the probability of failure to &#xd;
electromagnetic interference of the devices. In this paper, an &#xd;
alternative statistical analysis based on the Weibull distribution is &#xd;
used to analyze the electromagnetic immunity performance of &#xd;
operational amplifiers under different frequency interferences &#xd;
and modulation index. The results confirm the feasibility of the &#xd;
Weibull distribution to evaluate the radiofrequency interference &#xd;
RFI behavior.</dc:description>
               <dc:description>Peer Reviewed</dc:description>
               <dc:description>Postprint (author’s final draft)</dc:description>
               <dc:date>2013</dc:date>
               <dc:type>Conference report</dc:type>
               <dc:relation>https://www.conftool.com/emceurope2013/index.php?page=browseSessions&amp;form_session=12</dc:relation>
               <dc:rights>Open Access</dc:rights>
               <dc:publisher>Institute of Electrical and Electronics Engineers (IEEE)</dc:publisher>
            </oai_dc:dc>
         </d:Statement>
      </d:Descriptor>
   </d:Item>
</d:DIDL></metadata></record></GetRecord></OAI-PMH>