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               <dc:title>Backscatter error bounds for the elastic lidar two-component inversion algorithm</dc:title>
               <dc:creator>Rocadenbosch Burillo, Francisco</dc:creator>
               <dc:creator>Frasier, S.</dc:creator>
               <dc:creator>Kumar, Dhiraj</dc:creator>
               <dc:creator>Lange Vega, Diego</dc:creator>
               <dc:creator>Gregorio López, Eduard</dc:creator>
               <dc:creator>Sicard, Michaël</dc:creator>
               <dc:subject>Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Teledetecció</dc:subject>
               <dc:subject>Remote sensing</dc:subject>
               <dc:subject>Backscatter coefficient</dc:subject>
               <dc:subject>Fernald algorithm</dc:subject>
               <dc:subject>inversion</dc:subject>
               <dc:subject>lidar</dc:subject>
               <dc:subject>signal processing</dc:subject>
               <dc:subject>Teledetecció</dc:subject>
               <dc:description>Total backscatter-coefficient inversion error bounds for the two-component lidar inversion algorithm (so-called Fernald's or Klett-Fernald-Sasano's method) are derived in analytical form in response to the following three error sources: 1) the measurement noise; 2) the user uncertainty in the backscatter-coefficient calibration; and 3) the aerosol extinction-to-backscatter ratio. The following two different types of error bounds are presented: 1) approximate error bounds using first-order error propagation and 2) exact error bounds using a total-increment method. Both error bounds are formulated in explicit analytical form, which is of advantage for practical physical sensitivity analysis and computational implementation. A Monte Carlo approach is used to validate the error bounds at 355-, 532-, and 1064-nm wavelengths.</dc:description>
               <dc:description>Peer Reviewed</dc:description>
               <dc:description>Postprint (published version)</dc:description>
               <dc:date>2012-11</dc:date>
               <dc:type>Article</dc:type>
               <dc:relation>http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6205622&amp;tag=1</dc:relation>
               <dc:rights>Restricted access - publisher's policy</dc:rights>
               <dc:publisher>Institute of Electrical and Electronics Engineers (IEEE)</dc:publisher>
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