2026-04-17T13:10:50Zhttps://recercat.cat/oai/request

oai:recercat.cat:2117/1683672026-01-15T08:15:07Zcom_2072_1033col_2072_452950

Characterization of speckle patterns generated by a semiconductor laser with optical feedback for speckle reduction in retinal imaging instruments Halpaap, Donatus Tiana Alsina, Jordi Vilaseca Ricart, Meritxell Masoller Alonso, Cristina Universitat Politècnica de Catalunya. Departament de Física Universitat Politècnica de Catalunya. Departament d'Òptica i Optometria Universitat Politècnica de Catalunya. DONLL - Dinàmica no Lineal, Òptica no Lineal i Làsers Universitat Politècnica de Catalunya. GREO - Grup de Recerca en Enginyeria Òptica Àrees temàtiques de la UPC::Ciències de la visió Eye--Accommodation and refraction Optical measurements Retina Speckle reduction Double pass imaging Eye optical quality Ulls -- Acomodació i refracció Òptica -- Mesuraments Retina We study experimentally the operating conditions of a semiconductor laser diode subjected to different amounts of optical feedback in order to find a stable and cost-efficient solution for speckle reduction in double-pass retinal imaging. Peer Reviewed Postprint (published version) 2019 Conference lecture Halpaap, D. [et al.]. Characterization of speckle patterns generated by a semiconductor laser with optical feedback for speckle reduction in retinal imaging instruments. A: European Conferences on Biomedical Optics. "Proceedings of SPIE 11078: Optical Coherence Imaging Techniques and Imaging in Scattering Media III". Washington: International Society for Photo-Optical Instrumentation Engineers (SPIE), 2019, p. 110782A-1-110782A-3. https://hdl.handle.net/2117/168367 10.1117/12.2526761 eng https://www.spiedigitallibrary.org/conference-proceedings-of-spie/11078/110782A/Characterization-of-speckle-patterns-generated-by-a-semiconductor-laser-with/10.1117/12.2526761.short info:eu-repo/grantAgreement/EC/H2020/675512/EU/Advanced BiomEdical OPTICAL Imaging and Data Analysis/BE-OPTICAL Restricted access - publisher's policy application/pdf International Society for Photo-Optical Instrumentation Engineers (SPIE)