2026-04-18T02:07:15Zhttps://recercat.cat/oai/request

oai:recercat.cat:2117/167252026-02-02T09:54:13Zcom_2072_1033col_2072_452950

Quantification of dissipation and deformation in ambient atomic force microscopy Santos Hernández, Sergio Gadelrab,, K. Barcons Xixons, Víctor Stefancich, M. Chiesa, Matteo Universitat Politècnica de Catalunya. Departament de Disseny i Programació de Sistemes Electrònics Universitat Politècnica de Catalunya. SEPIC - Sistemes Electrònics de Potència i de Control Àrees temàtiques de la UPC::Física Àrees temàtiques de la UPC::Enginyeria electrònica Atomic force microscopy Dissipative process Energy hysteresis Picometer resolution Sample deformation Unknown quantity Microscòpia de força atòmica A formalism to extract and quantify unknown quantities such as sample deformation, the viscosity of the sample and surface energy hysteresis in amplitude modulation atomic force microscopy is presented. Recovering the unknowns only requires the cantilever to be accurately calibrated and the dissipative processes occurring during sample deformation to be well modeled. The theory is validated by comparison with numerical simulations and shown to be able to provide, in principle, values of sample deformation with picometer resolution. Postprint (published version) 2012-07-20 Article Santos, S. [et al.]. Quantification of dissipation and deformation in ambient atomic force microscopy. "New journal of physics", 20 Juliol 2012, vol. 14, p. 1-12. 1367-2630 https://hdl.handle.net/2117/16725 10.1088/1367-2630/14/7/073044 eng http://iopscience.iop.org/1367-2630/14/7/073044 Restricted access - publisher's policy 12 p. application/pdf