2026-04-17T08:13:10Zhttps://recercat.cat/oai/request

oai:recercat.cat:2117/167252026-02-02T09:54:13Zcom_2072_1033col_2072_452950

00925njm 22002777a 4500 dc Santos Hernández, Sergio author Gadelrab,, K. author Barcons Xixons, Víctor author Stefancich, M. author Chiesa, Matteo author 2012-07-20 A formalism to extract and quantify unknown quantities such as sample deformation, the viscosity of the sample and surface energy hysteresis in amplitude modulation atomic force microscopy is presented. Recovering the unknowns only requires the cantilever to be accurately calibrated and the dissipative processes occurring during sample deformation to be well modeled. The theory is validated by comparison with numerical simulations and shown to be able to provide, in principle, values of sample deformation with picometer resolution. Postprint (published version) Àrees temàtiques de la UPC::Física Àrees temàtiques de la UPC::Enginyeria electrònica Atomic force microscopy Dissipative process Energy hysteresis Picometer resolution Sample deformation Unknown quantity Microscòpia de força atòmica Quantification of dissipation and deformation in ambient atomic force microscopy