<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-04-13T01:04:02Z</responseDate><request verb="GetRecord" identifier="oai:www.recercat.cat:2117/1390" metadataPrefix="oai_dc">https://recercat.cat/oai/request</request><GetRecord><record><header><identifier>oai:recercat.cat:2117/1390</identifier><datestamp>2025-07-17T11:12:19Z</datestamp><setSpec>com_2072_1033</setSpec><setSpec>col_2072_452950</setSpec></header><metadata><oai_dc:dc xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
   <dc:title>Propagation of measurement noise through backprojection reconstruction in electrical impedance tomography</dc:title>
   <dc:creator>Frangi Caregnato, Alejandro</dc:creator>
   <dc:creator>Riu Costa, Pere Joan</dc:creator>
   <dc:creator>Rosell Ferrer, Francisco Javier</dc:creator>
   <dc:creator>Viergever, Max A.</dc:creator>
   <dc:contributor>Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica</dc:contributor>
   <dc:contributor>Universitat Politècnica de Catalunya. IEB - Instrumentació Electrònica i Biomèdica</dc:contributor>
   <dc:subject>Àrees temàtiques de la UPC::Enginyeria biomèdica::Electrònica biomèdica</dc:subject>
   <dc:subject>Electrodiagnosis</dc:subject>
   <dc:subject>Computer vision</dc:subject>
   <dc:subject>Electric impedance imaging</dc:subject>
   <dc:subject>Gaussian distribution</dc:subject>
   <dc:subject>Image reconstruction</dc:subject>
   <dc:subject>Measurement errors</dc:subject>
   <dc:subject>Medical image processing</dc:subject>
   <dc:subject>Backprojection reconstruction</dc:subject>
   <dc:subject>Medical diagnostic imaging</dc:subject>
   <dc:subject>Electrical impedance tomography</dc:subject>
   <dc:subject>Error propagation theory</dc:subject>
   <dc:subject>Reconstruction error characterization</dc:subject>
   <dc:subject>Spatial characterization</dc:subject>
   <dc:subject>Current drivers</dc:subject>
   <dc:subject>Voltage detectors</dc:subject>
   <dc:subject>Acquisition system architecture</dc:subject>
   <dc:subject>Spatially nonstationary Gaussian distribution</dc:subject>
   <dc:subject>Electrodiagnòstic</dc:subject>
   <dc:subject>Visió per ordinador en medicina</dc:subject>
   <dc:description>A framework to analyze the propagation of measurement noise through backprojection reconstruction algorithms in electrical impedance tomography (EIT) is presented. Two&#xd;
measurement noise sources were considered: noise in the current drivers and in the voltage detectors. The influence of the acquisition system architecture (serial/semi-parallel) is also discussed. Three variants of backprojection reconstruction are studied:&#xd;
basic (unweighted), weighted and exponential backprojection. &#xd;
The results of error propagation theory have been compared with those obtained from simulated and experimental data. This&#xd;
comparison shows that the approach provides a good estimate of the reconstruction error variance. It is argued that the reconstruction error in EIT images obtained via backprojection can be approximately modeled as a spatially nonstationary Gaussian&#xd;
distribution. This methodology allows us to develop a spatial characterization of the reconstruction error in EIT images.</dc:description>
   <dc:description>Peer Reviewed</dc:description>
   <dc:date>2002-06-30</dc:date>
   <dc:type>Article</dc:type>
   <dc:identifier>Frangi, AF; Riu, PJ; Rosell J; Viergever, MA. Propagation of measurement noise through backprojection reconstruction in electrical impedance tomography. IEEE Transactions on Medical Imaging, 2002, vol. 21 núm. 6, p. 566-578</dc:identifier>
   <dc:identifier>0278-0062</dc:identifier>
   <dc:identifier>https://hdl.handle.net/2117/1390</dc:identifier>
   <dc:language>eng</dc:language>
   <dc:relation>DGICYT PB93-0952</dc:relation>
   <dc:rights>Open Access</dc:rights>
   <dc:format>566-578</dc:format>
   <dc:format>application/pdf</dc:format>
   <dc:publisher>IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC</dc:publisher>
</oai_dc:dc></metadata></record></GetRecord></OAI-PMH>