2026-04-17T00:53:00Zhttps://recercat.cat/oai/request

oai:recercat.cat:2117/1174232026-02-07T06:57:12Zcom_2072_1033col_2072_452950

00925njm 22002777a 4500 dc Vidas, Luciana author Günther, Christian M. author Miller, Timothy A. author Pfau, Bastian author Perez-Salinas, Daniel author Martínez, Elías author Schneider, Michael author Guehers, Erik author Gargiani, Pierluigi author Valvidares, Manuel author Marvel, Robert E. author Hallman, Kent A. author Haglund, Richard F. author Eisebitt, Stefan author Wall, Simon author 2018-05-16 We use resonant soft X-ray holography to image the insulator−metal phase transition in vanadium dioxide with element and polarization specificity and nanometer spatial resolution. We observe that nanoscale inhomogeneity in the film results in spatial-dependent transition pathways between the insulating and metallic states. Additional nanoscale phases form in the vicinity of defects which are not apparent in the initial or final states of the system, which would be missed in area-integrated X-ray absorption measurements. These intermediate phases are vital to understand the phase transition in VO2, and our results demonstrate how resonant imaging can be used to understand the electronic properties of phase-separated correlated materials obtained by X-ray absorption. Peer Reviewed Postprint (author's final draft) Àrees temàtiques de la UPC::Física Holography holography Holografia Imaging Nanometer Phase Coexistence at Defects During the Insulator−Metal Phase Transformation in VO2 Thin Films by Resonant Soft X‑ray Holography