2026-04-13T01:46:54Zhttps://recercat.cat/oai/request
oai:recercat.cat:2072/4883052025-10-30T14:38:40Zcom_2072_98col_2072_378192
RECERCAT author Baghban-Bousari, N. author Eric, Deborah author Palau, Gerard author Crespo Yepes, Albert author Porti i Pujal, Marc author Ramon, Eloi author Ogier, S. author Nafría i Maqueda, Montserrat 2026 Altres ajuts: acords transformatius de la UABPre-stressed commercial Organic Thin Film Transistors (OTFT) have been characterized to evaluate their suitability for Physical Unclonable Functions (PUFs) implementation, when the variability of the drain current (ID) is used as entropy source. Different kinds of electrical pre-stresses have been considered, to study their impact on the PUF reproducibility. Uniqueness and Uniformity of the resulting PUFs have also been evaluated. The proposed pre-stressed OTFTs based PUFs show a reproducibility up to 0.99, with a uniformity and uniqueness of 0.52 and 0.50, respectively. open access Aquest document està subjecte a una llicència d'ús Creative Commons. Es permet la reproducció total o parcial, la distribució, la comunicació pública de l'obra i la creació d'obres derivades, fins i tot amb finalitats comercials, sempre i quan es reconegui l'autoria de l'obra original. https://creativecommons.org/licenses/by/4.0/ OTFT PUF Reliability Uniformity Uniqueness Feasibility of Physical Unclonable Functions from Pre-stressed Organic Thin Film Transistors for Secure Microelectronics Article