2026-04-17T15:05:20Zhttps://recercat.cat/oai/request

oai:recercat.cat:2072/4883052025-10-30T14:38:40Zcom_2072_98col_2072_378192

00925njm 22002777a 4500 dc Baghban-Bousari, N. author Eric, Deborah author Palau, Gerard author Crespo Yepes, Albert author Porti i Pujal, Marc author Ramon, Eloi author Ogier, S. author Nafría i Maqueda, Montserrat author 2026 Altres ajuts: acords transformatius de la UAB Pre-stressed commercial Organic Thin Film Transistors (OTFT) have been characterized to evaluate their suitability for Physical Unclonable Functions (PUFs) implementation, when the variability of the drain current (ID) is used as entropy source. Different kinds of electrical pre-stresses have been considered, to study their impact on the PUF reproducibility. Uniqueness and Uniformity of the resulting PUFs have also been evaluated. The proposed pre-stressed OTFTs based PUFs show a reproducibility up to 0.99, with a uniformity and uniqueness of 0.52 and 0.50, respectively. OTFT PUF Reliability Uniformity Uniqueness Feasibility of Physical Unclonable Functions from Pre-stressed Organic Thin Film Transistors for Secure Microelectronics