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00925njm 22002777a 4500 dc Sandell, Susanne author Chávez Ángel, Emigdio author Sachat, Alexandros el author He, Jianying author Sotomayor Torres, Clivia M. author Maire, Jeremie author 2020 This AIP article is published under license by AIP: https://publishing.aip.org/wp-content/uploads/2019/10/AIPP-Author-License.pdfPublishing.https://pubs.acs.org/page/policy/authorchoice_termsofuse.html Altres ajuts: ICN2 is supported by the CERCA Programme/Generalitat de Catalunya. The widespread use of nanostructures and nanomaterials has opened up a whole new realm of challenges in thermal management, but also leads to possibilities for energy conversion, storage, and generation, in addition to numerous other technological applications. At the microscale and below, standard thermal measurement techniques reach their limits, and several novel methods have been developed to overcome these limitations. Among the most recent, contactless photothermal methods have been widely used and have proved their advantages in terms of versatility, temporal and spatial resolution, and even sensitivity in some situations. Among them, thermoreflectance and Raman thermometry have been used to measure the thermal properties from bulk materials to thin films, multilayers, suspended structures, and nanomaterials. This Tutorial presents the principles of these two techniques and some of their most common implementations. It expands to more advanced systems for spatial mapping and for probing of non-Fourier thermal transport. Finally, this paper concludes with discussing the limitations and perspectives of these techniques and future directions in nanoscale thermometry. Nanoscale thermometries Photothermal methods Property characterizations Suspended structure Technological applications Temporal and spatial Thermal measurement technique Thermoreflectance Thermoreflectance techniques and Raman thermometry for thermal property characterization of nanostructures