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Exchange biasing and electric polarization with YMnO3 Martí Rovirosa, Xavier Sánchez Barrera, Florencio Hrabovsky, D. Fábrega Sánchez, Lourdes Ruyter, A. Fontcuberta, Josep Laukhin, Vladimir Skumryev, Vassil García-Cuenca Varona, María Victoria Ferrater Martorell, Cèsar Varela Fernández, Manuel, 1956- Vilà, A. Lüders, Ulrike Anne Bobo, Jean-François American Physical Society Ferroelectric materials Epitaxy Ozone Atomic force microscopy Exchange interactions Ferromagnetic materials Ferroelectric thin films Thin film growth X-ray diffraction Polarization This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. We report on the growth and functional characterizations of epitaxialthin films of the multiferroic YMnO3. We show that using Pt as a seed layer on SrTiO3(111) substrates, epitaxialYMnO3films (0001) textured are obtained. An atomic force microscope has been used to polarize electric domains revealing the ferroelectric nature of the film. When a Permalloy layer is grown on top of the YMnO3(0001)film, clear indications of exchange bias and enhanced coercivity are observed at low temperature. The observation of coexisting antiferromagnetism and electrical polarization suggests that the biferroic character of YMnO3 can be exploited in novel devices. 2006 Article Applied physics letters ; Vol. 89, Issue 3 (July 2006), p. 032510/1-032510/3 open access Aquest material està protegit per drets d'autor i/o drets afins. Podeu utilitzar aquest material en funció del que permet la legislació de drets d'autor i drets afins d'aplicació al vostre cas. Per a d'altres usos heu d'obtenir permís del(s) titular(s) de drets. https://rightsstatements.org/vocab/InC/1.0/