<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-04-13T01:11:34Z</responseDate><request verb="GetRecord" identifier="oai:www.recercat.cat:2072/401719" metadataPrefix="qdc">https://recercat.cat/oai/request</request><GetRecord><record><header><identifier>oai:recercat.cat:2072/401719</identifier><datestamp>2024-11-25T22:59:27Z</datestamp><setSpec>com_2072_98</setSpec><setSpec>col_2072_378192</setSpec></header><metadata><qdc:qualifieddc xmlns:qdc="http://dspace.org/qualifieddc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:dcterms="http://purl.org/dc/terms/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://purl.org/dc/elements/1.1/ http://dublincore.org/schemas/xmls/qdc/2006/01/06/dc.xsd http://purl.org/dc/terms/ http://dublincore.org/schemas/xmls/qdc/2006/01/06/dcterms.xsd http://dspace.org/qualifieddc/ http://www.ukoln.ac.uk/metadata/dcmi/xmlschema/qualifieddc.xsd">
   <dc:title>Integrated tunneling sensor for nanoelectromechanical systems</dc:title>
   <dc:creator>Sadewasser, Sascha</dc:creator>
   <dc:creator>Abadal Berini, Gabriel</dc:creator>
   <dc:creator>Barniol i Beumala, Núria</dc:creator>
   <dc:creator>Dohn, S.</dc:creator>
   <dc:creator>Boisen, A.</dc:creator>
   <dc:creator>Fonseca Chácharo, Luis Antonio</dc:creator>
   <dc:creator>Esteve, Jaume</dc:creator>
   <dc:creator>American Physical Society</dc:creator>
   <dc:subject>Tunneling</dc:subject>
   <dc:subject>Electrodes</dc:subject>
   <dc:subject>Nanoelectromechanical systems</dc:subject>
   <dc:subject>Microelectromechanical systems</dc:subject>
   <dc:subject>Electrostatics</dc:subject>
   <dc:subject>Image sensors</dc:subject>
   <dc:subject>Infrared detectors</dc:subject>
   <dc:subject>Micromachining</dc:subject>
   <dc:subject>Silicon detectors</dc:subject>
   <dc:subject>Van der Waals forces</dc:subject>
   <dcterms:abstract>Transducers based on quantum mechanical tunneling provide an extremely sensitive sensor principle, especially for nanoelectromechanical systems. For proper operation a gap between the electrodes of below 1nm is essential, requiring the use of structures with a mobile electrode. At such small distances, attractive van der Waals and capillary forces become sizable, possibly resulting in snap-in of the electrodes. The authors present a comprehensive analysis and evaluation of the interplay between the involved forces and identify requirements for the design of tunnelingsensors. Based on this analysis, a tunnelingsensor is fabricated by Si micromachiningtechnology and its proper operation is demonstrated.</dcterms:abstract>
   <dcterms:issued>2006</dcterms:issued>
   <dc:type>Article</dc:type>
   <dc:relation>Applied physics letters ; Vol. 89, Issue 17 (October 2006), p. 173101/1-173101/3</dc:relation>
   <dc:rights>open access</dc:rights>
   <dc:rights>Aquest material està protegit per drets d'autor i/o drets afins. Podeu utilitzar aquest material en funció del que permet la legislació de drets d'autor i drets afins d'aplicació al vostre cas. Per a d'altres usos heu d'obtenir permís del(s) titular(s) de drets.</dc:rights>
   <dc:rights>https://rightsstatements.org/vocab/InC/1.0/</dc:rights>
   <dc:publisher/>
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