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00925njm 22002777a 4500 dc Camarero, Julio author Miguel, J. author Goedkoop, J. B. author Vogel, Jan author Romanens, F. author Pizzini, S. author Garcia, F. author Sort Viñas, Jordi author Dieny, Bernard author Brookes, N. B. author American Physical Society author 2006 This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. Soft x-ray resonant magnetic scattering has been used to investigate the element-selective microscopic magnetization reversal behavior of room temperature perpendicular exchange coupled ferromagnetic∕antiferromagnetic (F∕AF) systems and to study the role of the interfacial coupling strength on it. Different nucleation processes and domain size distributions along the decreasing and increasing branches of the reversal have been found. The size of the magnetic domains during reversal depends on both the F anisotropy and F∕AF coupling strength, decreasing when one of them increases. Evidence of the exchange bias(coercivity enhancement) being induced by pinned (unpinned) uncompensated AF interfacial spins is also shown. Magnetization reversals Nucleation Exchange interactions Thin film nucleation Coercive force Magnetic hysteresis F region Interface structure Magnetic anisotropy Magnetic films Magnetization reversal, asymmetry, and role of uncompensated spins in perpendicular exchange coupled systems