<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-04-20T00:43:17Z</responseDate><request verb="GetRecord" identifier="oai:www.recercat.cat:2072/398990" metadataPrefix="oai_dc">https://recercat.cat/oai/request</request><GetRecord><record><header><identifier>oai:recercat.cat:2072/398990</identifier><datestamp>2024-11-30T23:04:37Z</datestamp><setSpec>com_2072_98</setSpec><setSpec>col_2072_378192</setSpec></header><metadata><oai_dc:dc xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
   <dc:title>First-order reversal curve analysis of graded anisotropy FePtCu films</dc:title>
   <dc:creator>Bonanni, Valentina</dc:creator>
   <dc:creator>Fang, Yeyu</dc:creator>
   <dc:creator>Dumas, Randy K.</dc:creator>
   <dc:creator>Zha, Chaolin</dc:creator>
   <dc:creator>Bonetti, Stefano</dc:creator>
   <dc:creator>Nogués, Josep</dc:creator>
   <dc:creator>Aakerman, Johan</dc:creator>
   <dc:creator>American Physical Society</dc:creator>
   <dc:subject>Física aplicada</dc:subject>
   <dc:description>This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.</dc:description>
   <dc:description>The reversal mechanisms of graded anisotropy FePtCu films have been investigated by alternating gradient magnetometer AGM and magneto-optical Kerr effect MOKE measurements with first-order reversal curve FORC techniques. The AGM-FORC analysis, which clearly shows the presence of soft and hard components, is unable to resolve how these phases are distributed throughout the film thickness. MOKE-FORC measurements, which preferentially probe the surface of the film, reveal that the soft components are indeed located toward the top surface. Combining AGM-FORC with the inherent surface sensitivity of MOKE-FORC analysis allows for a comprehensive analysis of heterogeneous systems such as graded materials.</dc:description>
   <dc:date>2010</dc:date>
   <dc:type>Article</dc:type>
   <dc:identifier>https://ddd.uab.cat/record/106917</dc:identifier>
   <dc:identifier>urn:10.1063/1.3515907</dc:identifier>
   <dc:identifier>urn:oai:ddd.uab.cat:106917</dc:identifier>
   <dc:identifier>urn:articleid:10773118v97n20p202501</dc:identifier>
   <dc:identifier>urn:scopus_id:78649234796</dc:identifier>
   <dc:identifier>urn:wos_id:000284545200034</dc:identifier>
   <dc:identifier>urn:oai:egreta.uab.cat:publications/4c31c3c1-f0ec-485b-b761-2e4f252f52cb</dc:identifier>
   <dc:identifier>urn:icn2uab:4130201</dc:identifier>
   <dc:language>eng</dc:language>
   <dc:relation>Applied physics letters ; Vol. 97, Issue 20 (November 2010), p. 202501-202503</dc:relation>
   <dc:rights>open access</dc:rights>
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   <dc:rights>https://rightsstatements.org/vocab/InC/1.0/</dc:rights>
   <dc:format>application/pdf</dc:format>
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