2026-04-17T14:07:12Zhttps://recercat.cat/oai/request

oai:recercat.cat:10459.1/4677722025-09-15T18:19:02Zcom_2072_3622col_2072_479130

00925njm 22002777a 4500 dc Amo, Aduragbemi author Soriano Soriano, José Miguel author 2021 Leaf rust, caused by the fungus Puccinia triticina Erikss (Pt), is a destructive disease affecting wheat (Triticum aestivum L.) and a threat to food security. Developing resistant cultivars represents a useful method of disease control, and thus, understanding the genetic basis for leaf rust resistance is required. To this end, a comprehensive bibliographic search for leaf rust resistance quantitative trait loci (QTL) was performed, and 393 QTL were collected from 50 QTL mapping studies. Afterward, a consensus map with a total length of 4,567 cM consisting of different types of markers (simple sequence repeat [SSR], diversity arrays technology [DArT], chip-based single-nucleotide polymorphism [SNP] markers, and SNP markers from genotyping-by-sequencing) was used for QTL projection, and meta-QTL (MQTL) analysis was performed on 320 QTL. A total of 75 MQTL were discovered and refined to 15 high-confidence MQTL (hcmQTL). The candidate genes discovered within the hcmQTL interval were then checked for differential expression using data from three transcriptome studies, resulting in 92 differentially expressed genes (DEGs). The expression of these genes in various leaf tissues during wheat development was explored. This study provides insight into leaf rust resistance in wheat and thereby provides an avenue for developing resistant cultivars by incorporating the most important hcmQTL. This study was funded by project PID2019-109089RB-C31from the Spanish Ministry of Science and Innovation. JMSthanks the CERCA Programme/Generalitat de Catalunya(http://cerca.cat/) for supporting this research QTL MQTL Disease control Mapping studies Genetic mapping Unravelling consensus genomic regions conferring leaf rustresistance in wheat via meta-QTL analysis