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oai:recercat.cat:10230/205172025-12-13T21:20:46Zcom_2072_6col_2072_452952

Outage probability analysis for MRC in η-μ fading channels with co-channel interference Morales-Jiménez, David Paris, José F. Lozano Solsona, Angel Ràdio -- Interferències Comunicació sense fil, Sistemes de Outage probability η-μ fading Co-channel interference (CCI) Maximal ratio combining (MRC) Exact closed-form expressions are obtained for the outage probability of maximal ratio combining in η-μ fading/nchannels with antenna correlation and co-channel interference. The scenario considered in this work assumes the joint presence of background white Gaussian noise and independent Rayleigh-faded interferers with arbitrary powers. Outage probability results are obtained through an appropriate generalization of the moment-generating function of the/nη-μ fading distribution, for which new closed-form expressions are provided. The work of D. Morales and A. Lozano is supported by AGAUR (2009/nSGR 70) and by the Spanish Ministry of Science and Innovation (Ref. CONSOLIDER-INGENIO CSD2008-00010 ”COMONSENS”). The work of J. F. Paris was supported in part by the Spanish Government and FEDER project TEC2011-25473. 2013-03-22T10:21:51Z 2013-03-22T10:21:51Z 2012 info:eu-repo/semantics/article info:eu-repo/semantics/acceptedVersion Morales-Jiménez D, Paris JF, Lozano A. Outage probability analysis for MRC in η-μ fading channels with co-channel interference. IEEE Communications Letters. 2012; 16(5): 674-677. DOI 10.1109/LCOMM.2012.031212.120154 1089-7798 http://hdl.handle.net/10230/20517 http://dx.doi.org/10.1109/LCOMM.2012.031212.120154 eng IEEE Communications Letters. 2012; 16(5) info:eu-repo/grantAgreement/ES/3PN/TEC2011-25473 info:eu-repo/grantAgreement/ES/3PN/CSD2008-00010 © 2012 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works./nThe final published article can be found at http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6171806 info:eu-repo/semantics/openAccess application/pdf application/pdf Institute of Electrical and Electronics Engineers (IEEE)