DIMP: A low-cost diversity metric based on circuit path analysis

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To access the full text documents, please follow this link: http://hdl.handle.net/2117/107546

dc.contributor	Universitat Politècnica de Catalunya. Departament de Matemàtiques
dc.contributor	Universitat Politècnica de Catalunya. GRHCT - Grup de Recerca d'Història de la Ciència i de la Tècnica
dc.contributor.author	Alcaide, Sergi
dc.contributor.author	Hernandez, Carles
dc.contributor.author	Roca, Antoni
dc.contributor.author	Abella, Jaume
dc.date	2017
dc.identifier.citation	Alcaide, S., Hernandez, C., Roca, A., Abella, J. DIMP: A low-cost diversity metric based on circuit path analysis. A: Design Automation Conference. "DAC '17 Proceedings of the 54th Annual Design Automation Conference 2017". 2017, p. 45 : 1-45 : 6.
dc.identifier.citation	10.1145/3061639.3062231
dc.identifier.uri	http://hdl.handle.net/2117/107546
dc.language.iso	eng
dc.relation	http://dl.acm.org/citation.cfm?id=3062231
dc.relation	info:eu-repo/grantAgreement/ES/1PE/TIN2015-65316-P
dc.relation	info:eu-repo/grantAgreement/ES/1PE/TIN2014-60404-JIN
dc.relation	info:eu-repo/grantAgreement/ES/1PE/RYC-2013-14717
dc.rights	Attribution-NonCommercial-NoDerivs 3.0 Spain
dc.rights	http://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subject	Àrees temàtiques de la UPC::Informàtica
dc.subject	Microcontrollers
dc.subject	Automòbils -- Equip electrònic
dc.subject	Microprocessadors
dc.subject	Circuits integrats
dc.title	DIMP: A low-cost diversity metric based on circuit path analysis
dc.type	info:eu-repo/semantics/publishedVersion
dc.type	info:eu-repo/semantics/conferenceObject
dc.description.abstract	Diversity has been regarded as a desirable property of redundant instances, since it allows circuits to behave differently in front of a given fault. However, while qualitatively diversity is a well-understood concept, usable efficient metrics do not exist to quantify diversity in the context of safety-related systems. In this paper we cover this gap by proposing DIMP, a low-cost diversity metric based on analyzing the paths of the redundant circuits. We relate it to the particular case of automotive microcontrollers implementing lockstep cores and show that it can be successfully used providing relevant information for addressing common cause faults.
dc.description.abstract	This work has been partially supported by the Spanish Ministry of Economy and Competitiveness (MINECO) under grant TIN2015-65316-P and the HiPEAC Network of Excellence. Jaume Abella has been partially supported by the MINECO under Ramon y Cajal postdoctoral fellowship number RYC-2013-14717. Carles Hernández is jointly funded by the MINECO and FEDER funds through grant TIN2014-60404-JIN.

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