S-parameter measurement of chip Ga As FETs up to 22 GHz using the TRL calibration technique

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Title:	S-parameter measurement of chip Ga As FETs up to 22 GHz using the TRL calibration technique
Author:	Pradell i Cara, Lluís; Artal, E; Sabater, C
Other authors:	Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions; Universitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones
Abstract:	In this paper, the design of a Microstrip Test Fixture for TRL calibration is described. Experimental results for S-parameters measurement of a GaAs FET chip in the 3-22 GHz frequency range are presented. Repeatability of connections and measurements is discussed and experimental results are also presented.
Abstract:	Peer Reviewed
Subject(s):	-Àrees temàtiques de la UPC::Enginyeria de la telecomunicació -Radio frequency -Calibration -Connectors -Radiofreqüència
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Document type:	Article - Published version Conference Object
Published by:	Institute of Electrical and Electronics Engineers (IEEE)
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