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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Arquitectura de Computadors |
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dc.contributor | Universitat Politècnica de Catalunya. ARCO - Microarquitectura i Compiladors |
dc.contributor.author | Riera Villanueva, Marc |
dc.contributor.author | Canal Corretger, Ramon |
dc.contributor.author | Abella, Jaume |
dc.contributor.author | González Colás, Antonio María |
dc.date | 2016 |
dc.identifier.citation | Riera, M., Canal, R., Abella, J., Gonzalez, A. A detailed methodology to compute soft error rates in advanced technologies. A: Design, Automation & Test in Europe Conference & Exhibition. "Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE): 14-18 March 2016, ICC, Dresden, Germany". Dresden: Institute of Electrical and Electronics Engineers (IEEE), 2016, p. 217-222. |
dc.identifier.citation | 978-3-9815370-6-2 |
dc.identifier.uri | http://hdl.handle.net/2117/98176 |
dc.language.iso | eng |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) |
dc.relation | http://ieeexplore.ieee.org/document/7459307/ |
dc.relation | info:eu-repo/grantAgreement/ES/1PE/TIN2013-44375-R |
dc.relation | info:eu-repo/grantAgreement/EC/FP7/611404/EU/Cross-Layer Early Reliability Evaluation for the Computing cOntinuum/CLERECO |
dc.relation | info:eu-repo/grantAgreement/ES/RYC-2013-14717 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Circuits integrats |
dc.subject | Àrees temàtiques de la UPC::Informàtica |
dc.subject | Integrated circuits |
dc.subject | Software engineering |
dc.subject | Error correction |
dc.subject | Radiation hardening |
dc.subject | Reconfigurable hardware |
dc.subject | Advanced technology |
dc.subject | Circuit description |
dc.subject | Future technologies |
dc.subject | Operating condition |
dc.subject | Soft error rate |
dc.subject | System reliability |
dc.subject | Through current |
dc.subject | Transient faults |
dc.subject | Circuits integrats |
dc.subject | Enginyeria de programari |
dc.title | A detailed methodology to compute soft error rates in advanced technologies |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |
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