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dc.contributor | Barcelona Supercomputing Center |
---|---|
dc.contributor.author | Espinosa, Jaime |
dc.contributor.author | Hernandez, Carles |
dc.contributor.author | Abella, Jaume |
dc.date | 2015 |
dc.identifier.citation | Espinosa, Jaime; Hernandez, Carles; Abella, Jaume. Characterizing fault propagation in safety-critical processor designs. A: 21st International On-Line Testing Symposium (IOLTS), 6-8 July 2015, Halkidiki. "2015 IEEE 21st International On-Line Testing Symposium (IOLTS)". Institute of Electrical and Electronics Engineers (IEEE), 2015, p. 144-149. |
dc.identifier.citation | 1942-9398 |
dc.identifier.citation | 10.1109/IOLTS.2015.7229848 |
dc.identifier.uri | http://hdl.handle.net/2117/87264 |
dc.language.iso | eng |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) |
dc.relation | http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=7229848&url=http%3A%2F%2Fieeexplore.ieee.org%2Fxpls%2Fabs_all.jsp%3Farnumber%3D7229848 |
dc.relation | info:eu-repo/grantAgreement/ES/1PE/TIN2012-34557 |
dc.relation | info:eu-repo/grantAgreement/EC/FP7/287759/EU/High Performance and Embedded Architecture and Compilation/HIPEAC |
dc.relation | info:eu-repo/grantAgreement/ES/RYC-2013-14717 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
dc.subject | Simulation and Modeling |
dc.subject | Electronic systems |
dc.subject | Benchmark testing |
dc.subject | Circuit faults |
dc.subject | Microarchitecture |
dc.subject | Logic gates |
dc.subject | Digital simulation |
dc.subject | Safety-critical software |
dc.subject | Simulació, Mètodes de |
dc.subject | Sistemes electrònics de seguretat |
dc.title | Characterizing fault propagation in safety-critical processor designs |
dc.type | info:eu-repo/semantics/submittedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |
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