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Characterizing fault propagation in safety-critical processor designs
Espinosa, Jaime; Hernandez, Carles; Abella, Jaume
Barcelona Supercomputing Center
Àrees temàtiques de la UPC::Enginyeria electrònica
Simulation and Modeling
Electronic systems
Benchmark testing
Circuit faults
Microarchitecture
Logic gates
Digital simulation
Safety-critical software
Simulació, Mètodes de
Sistemes electrònics de seguretat
info:eu-repo/semantics/submittedVersion
info:eu-repo/semantics/conferenceObject
Institute of Electrical and Electronics Engineers (IEEE)
         

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