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Analysis and RTL correlation of instruction set simulators for automotive microcontroller robustness verification
Espinosa, Jaime; Hernandez, Carles; Abella, Jaume; de Andres, David; Ruiz, Juan C.
Barcelona Supercomputing Center
Àrees temàtiques de la UPC::Enginyeria electrònica
Simulation and Modeling
Automotive technology
Automotive engineering
Benchmark testing
Robustness
Electrònica--Automòbils
Simulació, Mètodes de
info:eu-repo/semantics/submittedVersion
info:eu-repo/semantics/conferenceObject
Institute of Electrical and Electronics Engineers (IEEE)
         

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