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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. GRUP ISI - Grup d'Instrumentació, Sensors i Interfícies |
dc.contributor.author | Cuadras Tomàs, Àngel |
dc.contributor.author | Crisóstomo, Javier |
dc.contributor.author | Ovejas Benedicto, Victòria Júlia |
dc.contributor.author | Quílez Figuerola, Marcos |
dc.date | 2015-10-28 |
dc.identifier.citation | Cuadras, A., Crisóstomo, J., Ovejas, V.J., Quilez, M. Irreversible entropy model for damage diagnosis in resistors. "Journal of applied physics", 28 Octubre 2015, vol. 118. |
dc.identifier.citation | 0021-8979 |
dc.identifier.citation | 10.1063/1.4934740 |
dc.identifier.uri | http://hdl.handle.net/2117/86549 |
dc.language.iso | eng |
dc.publisher | American Institute of Physics (AIP) |
dc.relation | http://dx.doi.org/10.1063/1.4934740 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.rights | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
dc.subject | Electric resistors |
dc.subject | entropy |
dc.subject | damage |
dc.subject | aging |
dc.subject | degradation |
dc.subject | resistor |
dc.subject | Resistors |
dc.title | Irreversible entropy model for damage diagnosis in resistors |
dc.type | info:eu-repo/semantics/submittedVersion |
dc.type | info:eu-repo/semantics/article |
dc.description.abstract |