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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat |
dc.contributor.author | Vatajelu, Elena Ioana |
dc.contributor.author | Rodríguez Montañés, Rosa |
dc.contributor.author | Indaco, Marco |
dc.contributor.author | Prinetto, Paolo |
dc.contributor.author | Figueras Pàmies, Joan |
dc.date | 2015 |
dc.identifier.citation | Vatajelu, E., Rodriguez, R., Indaco, M., Paolo Prinetto, Figueras, J. STT-MRAM cell reliability evaluation under process, voltage and temperature (PVT) variations. A: International Conference on Design & Technology of Integrated Systems in Nanoscale Era. "2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2015): Napoli, Italy: 21–23 April 2015". Napoli: Institute of Electrical and Electronics Engineers (IEEE), 2015, p. 1-6. |
dc.identifier.citation | 9781479920006 |
dc.identifier.citation | 10.1109/DTIS.2015.7127377 |
dc.identifier.uri | http://hdl.handle.net/2117/83144 |
dc.language.iso | eng |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) |
dc.relation | http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7127377 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.rights | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Informàtica |
dc.subject | Magnetic memory (Computers) |
dc.subject | reliability |
dc.subject | process variation |
dc.subject | voltage variation |
dc.subject | temperature |
dc.subject | STT-MRAM cell |
dc.subject | statistical analysis |
dc.subject | Memòria magnètica (Ordinadors) |
dc.title | STT-MRAM cell reliability evaluation under process, voltage and temperature (PVT) variations |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |
dc.description.abstract |