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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
dc.contributor.author | Pouyan, Peyman |
dc.contributor.author | Amat Bertran, Esteve |
dc.contributor.author | Rubio Sola, Jose Antonio |
dc.date | 2015 |
dc.identifier.citation | Pouyan, P.; Amat, Esteve; Rubio, A. Statistical Lifetime Analysis in Memristive Crossbar. A: Design, Automation and Test in Europe. "DATE Uncertainty Workshop". Grenoble: 2015. |
dc.identifier.uri | http://hdl.handle.net/2117/27219 |
dc.language.iso | eng |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
dc.rights | info:eu-repo/semantics/openAccess |
dc.rights | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
dc.subject | Electronic circuits |
dc.subject | Circuits elèctrics |
dc.subject | Circuits electrònics |
dc.title | Statistical Lifetime Analysis in Memristive Crossbar |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |
dc.description.abstract |