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Design and implementation of automatic test equipment IP module
Fransi Palos, Sergi; Farre Lozano, Goretti; Garcia Deiros, Lucas; Manich Bou, Salvador
Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Tolerància a Fallades
This paper presents an Intellectual Property (IP) module that includes fully functional autonomous Automatic Test Equipment (ATE). The module analyses responses from the Device Under Test (DUT) after sending test vectors to the device. Communication with the DUT is maintained through a synchronous bidirectional serial channel. The module has been designed for a fail-safe level of security, which means any single fault producing an erroneous output is detected. Several IP-ATEs can be synthesized in a single hardware platform to operate independently or coordinately.
Àrees temàtiques de la UPC::Enginyeria electrònica
Digital integrated circuits -- Testing
Automatic Testing
Digital Circuits
Field Programmable Gate Arrays
Intellectual Property
Low Power Tester
Low Cost ICs
Multisite Tester.
Circuits integrats digitals -- Proves
Institute of Electrical and Electronics Engineers (IEEE)

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