Process variations have a large impact on device and circuit reliability and performance. Few studies are focused on their impact on more complex systems, as for example their influence in a data path. In our study, the impact of variations in the memory cell block is the largest measured, as it is usually designed with the minimum device dimensions. Moreover, we observe a significant influence of the device type (p/nMOS) used to implement the memory cell in terms of delay and variability robustness.

Peer Reviewed