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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Òptica i Optometria |
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dc.contributor | Universitat Politècnica de Catalunya. GREO - Grup de Recerca en Enginyeria Òptica |
dc.contributor.author | Azcona Guerrero, Francisco Javier |
dc.contributor.author | Royo Royo, Santiago |
dc.contributor.author | Jha, Ajit |
dc.date | 2014 |
dc.identifier.citation | Azcona, F.; Royo, S.; Jha, A. Towards atomic force microscopy measurements using differential self-mixing interferometry. A: Annual IEEE Conference on Sensors. "The 13th IEEE SENSORS Conference Proceedings". València: Institute of Electrical and Electronics Engineers (IEEE), 2014, p. 766-770. |
dc.identifier.citation | 978-1-4799-0162-3 |
dc.identifier.citation | 10.1109/ICSENS.2014.6985112 |
dc.identifier.uri | http://hdl.handle.net/2117/26264 |
dc.language.iso | eng |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) |
dc.relation | http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6985112 |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
dc.rights | info:eu-repo/semantics/openAccess |
dc.rights | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Enginyeria dels materials |
dc.subject | Àrees temàtiques de la UPC::Ciències de la visió::Òptica física |
dc.subject | Microscopy--Measurement |
dc.subject | Interferometry |
dc.subject | Atomic force microscopy |
dc.subject | Self-mixing interferometry |
dc.subject | AFM |
dc.subject | lasers |
dc.subject | Interferometria |
dc.subject | Microscòpia de força atòmica |
dc.subject | Òptica -- Mesuraments |
dc.title | Towards atomic force microscopy measurements using differential self-mixing interferometry |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |
dc.description.abstract |