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Criteria for indirect measurements in M-S testing
Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan
Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Tolerància a Fallades
Analog and mixed-signal circuit testing is a cballenging task demanding large amounts of resources. In order to battle against this drawback, alternate testing has been established as an eflicient way of testing analog and M-S circuits by using indirect measures instead of the classic specification based testing. In this work we propose the use of Kendall's Tau rank correlation coeflicient for rating the suitability of a set of candidate indirect measures to be used in mixed-signal testing. Such criterion is shown to be adequate since it allows to avoid or minimize information redundancy in the measures set. As a proof of concept, a 4th order band-pass Butterworth filter has been simulated under the presence of process variations. The circuit has been tested using a subset of measures selected according to minimum Kendall's Tau coeflicient. Analog test efliciency metrics are reported showing test misclassification rate is among the best 15% possible, therefore validating the proposal.
Àrees temàtiques de la UPC::Enginyeria electrònica::Circuits electrònics
Àrees temàtiques de la UPC::Enginyeria electrònica::Instrumentació i mesura
Linear integrated circuits
Mixed signal circuits
Mixed-Signal Test
Analog Test
Alternate Test
Indirect Measurements
Alternate Feature Selection
Signature Selection
Optimum Measures Selection
Quadtrees
Octrees
Analog Filter
Circuits integrats lineals
Circuits integrats mixtos
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