Impact of adaptive proactive reconfiguration technique on Vmin and lifetime of SRAM caches

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Título:	Impact of adaptive proactive reconfiguration technique on Vmin and lifetime of SRAM caches
Autor/a:	Pouyan, Peyman; Amat Bertran, Esteve; Barajas Ojeda, Enrique; Rubio Sola, Jose Antonio
Otros autores:	Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions
Abstract:	This work presents a test and measurement technique to monitor aging and process variation status of SRAM cells as an aging-aware design technique. We have then verified our technique with an implemented chip. The obtained aging information are utilized to guide our proactive strategies, and to track the impact of aging in new reconfiguration techniques for cache memory structures. Our proactive techniques improve the reliability, extend the SRAMs lifetime, and reduce the Vmin drift in presence of process variation and BTI aging.
Materia(s):	-Àrees temàtiques de la UPC::Enginyeria electrònica -BTI -Process Variation -Reconfiguration -SRAM -Vmin -Memòries digitals
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Tipo de documento:	Artículo - Versión presentada Objeto de conferencia
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Pouyan, Peyman; Amat Bertran, Esteve; Rubio Sola, Jose Antonio

Rubio Sola, Jose Antonio; Amat Bertran, Esteve; Pouyan, Peyman

Pouyan, Peyman; Amat Bertran, Esteve; Rubio Sola, Jose Antonio

Pouyan, Peyman; Amat Bertran, Esteve; Rubio Sola, Jose Antonio

Pouyan, Peyman; Amat Bertran, Esteve; Moll Echeto, Francisco de Borja; Rubio Sola, Jose Antonio

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