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Use of reference limits in the Feature Selective Validation (FSV) method
Jauregui Telleria, Ricardo Ignacio; Pous Solà, Marc; Silva Martínez, Fernando
Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. IEB - Instrumentació Electrònica i Biomèdica
This paper presents a method for taking into account reference limits when the Feature Selective method (FSV) is applied. Nowadays, there is a long line of research that underlines the important role played by the FSV to perform an objective validation process. However, until now, there has been no consideration of a reference level in the validation process. This paper presents a methodology to calculate the FSV values when a reference limit is contemplated. We demonstrate the importance of this technique in the validation criteria for the Computational Electromagnetics and, more particularly, in the EMC comparison process. Finally, in order to show the application and the importance of the method, two real cases, considering different reference levels, are analysed.
Peer Reviewed
Àrees temàtiques de la UPC::Física::Electromagnetisme
Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica
Electromagnetic compatibility
Computer simulation
Computational Electromagnetics (CEM)
Computer simulation
Data comparison
Feature Selective Validation method (FSV)
Numerical simulation
Validation
Reference limits
Compatibilitat electromagnètica
Simulació per ordinador
Attribution-NonCommercial-NoDerivs 3.0 Spain
http://creativecommons.org/licenses/by-nc-nd/3.0/es/
info:eu-repo/semantics/publishedVersion
info:eu-repo/semantics/conferenceObject
Institute of Electrical and Electronics Engineers (IEEE)
         

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