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Title:
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Characterization and modeling of the conducted emission of integrated circuits up to 3 GHz
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Author:
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Berbel Artal, Néstor; Fernández García, Raúl; Gil Galí, Ignacio
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Other authors:
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Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. TIEG - Terrassa Industrial Electronics Group |
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Abstract:
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In this paper, an electrical model in order to predict the electromagnetic compatibility (EMC) conducted emission of integrated circuits (ICs) up to 3 GHz is presented. The electrical model predicts the behavior of the propagation paths of electromagnetic conducted emissions at high frequency by including all distributed effects and capacitive and inductive couplings. The proposed model has been compared with the standard IC emission model (ICEM-CE) to predict the EMC of a clock generator by means of the feature selective validation (FSV) method. The results show that the proposed model can expand the frequency range up to 3 GHz with a high degree of accuracy. Moreover, an alternative approach to model the electromagnetic noise that is based on the analysis of its spectral components is proposed. |
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Abstract:
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Peer Reviewed |
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Subject(s):
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-Àrees temàtiques de la UPC::Enginyeria electrònica::Circuits electrònics
-Integrated circuits
-Electromagnetic compatibility
-Microwave integrated circuits
-Impedance (Electricity)
-Conducted emissions
-electromagnetic compatibility (EMC)
-feature selective validation (FSV)
-integrated circuit (IC)
-IC emission model (ICEM-CE)
-internal activity (IA)
-computational electromagnetics CEM
-selective validation FSV
-Circuits integrats
-Compatibilitat electromagnètica
-Circuits integrats de microones
-Impedància (Electricitat) |
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Rights:
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Document type:
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Article - Published version
Article |
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