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Title:
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Failure distance-based simulation of repairable fault-tolerant systems
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Author:
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Carrasco, Juan A.
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Other authors:
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Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat |
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Abstract:
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This paper presents a new importance sampling scheme called failure biasing for the efficient simulation of Markovian models of repairable fault-tolerant systems. The new scheme enriches the failure biasing scheme previously proposed by exploiting the concept of failure distance. This results in a much more efficient simulation with speedups over failure biasing of orders of magnitude in typical cases. The paper also discusses the efficient implementation of the new importance sampling scheme and presents a practical method for the optimization of the biasing parameters. |
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Subject(s):
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-Àrees temàtiques de la UPC::Informàtica::Sistemes d'informació
-Fault-tolerant computing
-Tolerància als errors (Informàtica) |
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Rights:
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Document type:
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Article - Submitted version
Conference Object |
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Published by:
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Elsevier
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Share:
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