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Mueller matrix microscope with a dual continuous rotating compensator setup and digital demodulation
Arteaga Barriel, Oriol; Baldrís, Marta; Antó Roca, Joan; Canillas i Biosca, Adolf; Pascual Miralles, Esther; Bertrán Serra, Enric
Universitat de Barcelona
In this paper we describe a new Mueller matrix (MM) microscope that generalizes and makes quantitative the polarized light microscopy technique. In this instrument all the elements of the MU are simultaneously determined from the analysis in the frequency domain of the time-dependent intensity of the light beam at every pixel of the camera. The variations in intensity are created by the two compensators continuously rotating at different angular frequencies. A typical measurement is completed in a little over one minute and it can be applied to any visible wavelength. Some examples are presented to demonstrate the capabilities of the instrument.
El·lipsometria
Microscòpia
Ellipsometry
Microscopy
(c) Optical Society of America, 2014
Article
info:eu-repo/semantics/publishedVersion
Optical Society of America
         

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