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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
dc.contributor.author | Abdallah, L. |
dc.contributor.author | Stratigopoulos, H. G. |
dc.contributor.author | Mir, S. |
dc.contributor.author | Altet Sanahujes, Josep |
dc.date | 2013 |
dc.identifier.citation | Abdallah, L. [et al.]. Defect-oriented non-intrusive RF test using on-chip temperature sensors. A: IEEE VLSI Test Symposium. "2013 IEEE 31st VLSI Test Symposium (VTS): proceedings: April 29th - May 1st, 2013: Berkeley, California, USA". Berkeley, CA: Institute of Electrical and Electronics Engineers (IEEE), 2013, p. 57-62. |
dc.identifier.citation | 978-1-4673-5543-8 |
dc.identifier.citation | 10.1109/VTS.2013.6548889 |
dc.identifier.uri | http://hdl.handle.net/2117/22468 |
dc.language.iso | eng |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) |
dc.relation | http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6548889 |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
dc.rights | info:eu-repo/semantics/openAccess |
dc.rights | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Instrumentació i mesura::Sensors i actuadors |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Circuits integrats |
dc.subject | Temperature measuring instruments |
dc.subject | Integrated circuits -- Verification |
dc.subject | Integrated circuit testing |
dc.subject | Low noise amplifiers |
dc.subject | Radiofrequency amplifiers |
dc.subject | Temperature sensors |
dc.subject | Termometria -- Aparells i instruments |
dc.subject | Circuits integrats -- Verificació |
dc.title | Defect-oriented non-intrusive RF test using on-chip temperature sensors |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |
dc.description.abstract | |
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