Use this identifier to quote or link this document: http://hdl.handle.net/2072/227174

Optimized back-focal-plane interferometry directly measures forces of optically trapped particles
Farré, Arnau; Marsà, Ferran; Montes Usategui, Mario
2014-03-25
Interferometria
Piezoelectricitat
Làsers
Instruments òptics
Interferometry
Piezoelectricity
Lasers
Optical instruments
(c) Optical Society of America, 2012
Article
info:eu-repo/semantics/publishedVersion
Optical Society of America
         

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