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dc.contributor | Universitat Politècnica de Catalunya. Departament de Disseny i Programació de Sistemes Electrònics |
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dc.contributor.author | Santos Hernández, Sergio |
dc.date | 2013-12-02 |
dc.identifier.citation | Santos, S. Enhanced sensitivity and contrast with bimodal atomic force microscopy with small and ultra-small amplitudes in ambient conditions. "Applied physics letters", 02 Desembre 2013, vol. 103, núm. 23, p. 231603-1-231603-5. |
dc.identifier.citation | 0003-6951 |
dc.identifier.citation | 10.1063/1.4840075 |
dc.identifier.uri | http://hdl.handle.net/2117/21802 |
dc.language.iso | eng |
dc.relation | http://scitation.aip.org/content/aip/journal/apl/103/23/10.1063/1.4840075 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Àrees temàtiques de la UPC::Enginyeria de la telecomunicació |
dc.subject | Atomic force microscopy |
dc.subject | DNA |
dc.subject | Sample interaction regimes |
dc.subject | Modulation AFM |
dc.subject | Mode |
dc.subject | Spectroscopy |
dc.subject | Resolution |
dc.subject | Surface |
dc.subject | Energy |
dc.subject | Microscòpia de força atòmica |
dc.subject | ADN |
dc.title | Enhanced sensitivity and contrast with bimodal atomic force microscopy with small and ultra-small amplitudes in ambient conditions |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/article |
dc.description.abstract | |
dc.description.abstract |