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Enhanced sensitivity and contrast with bimodal atomic force microscopy with small and ultra-small amplitudes in ambient conditions
Santos Hernández, Sergio
Universitat Politècnica de Catalunya. Departament de Disseny i Programació de Sistemes Electrònics
Here, we introduce bimodal atomic force microscopy operated with sub-nm and ultra-small, i.e., sub-angstrom, first and second mode amplitudes in ambient conditions. We show how the tip can be made to oscillate in the proximity of the surface and in perpetual contact with the adsorbed water layers while the second mode amplitude and phase provide enhanced contrast and sensitivity. Nonlinear and nonmonotonic behavior of the experimental observables is discussed theoretically with a view to high resolution, enhanced contrast, and minimally invasive mapping. Fractions of meV of energy dissipation are shown to provide contrast above the noise level.
Peer Reviewed
Àrees temàtiques de la UPC::Enginyeria de la telecomunicació
Atomic force microscopy
Sample interaction regimes
Modulation AFM
Microscòpia de força atòmica

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Santos Hernández, Sergio; Barcons Xixons, Víctor; Christenson, Hugo K.; Billingsley, Daniel J.; Bonass, William A.; Font Teixidó, Josep; Thomson, Neil H.
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Font Teixidó, Josep; Santos Hernández, Sergio; Barcons Xixons, Víctor; Thomson, Neil H.; Verdaguer, Albert; Chiesa, Matteo