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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. TIEG - Terrassa Industrial Electronics Group |
dc.contributor.author | Berbel Artal, Néstor |
dc.contributor.author | Fernández García, Raúl |
dc.contributor.author | Gil Galí, Ignacio |
dc.date | 2013 |
dc.identifier.citation | Berbel, N.; Fernandez, R.; Gil, I. Characterization of conducted emission at high frequency under different temperature. A: International Workshop on Electromagnetic Compatibility of Integrated Circuits. "Proceedings of EMC COMPO 2013". Nara: 2013. |
dc.identifier.citation | 10.1109/EMCCompo.2013.6735190 |
dc.identifier.uri | http://hdl.handle.net/2117/21690 |
dc.language.iso | eng |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Electrònica de potència |
dc.subject | Integrated circuits |
dc.subject | Temperature |
dc.subject | EMC |
dc.subject | Integrated circuit |
dc.subject | conducted emission |
dc.subject | switching noise |
dc.subject | temperature impact |
dc.subject | Circuits integrats |
dc.subject | Temperatura -- Control |
dc.title | Characterization of conducted emission at high frequency under different temperature |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |
dc.description.abstract | |
dc.description.abstract |