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DTM: degraded test mode for fault-aware probabilistic timing analysis
Slijepcevic, Mladen; Kosmidis, Leonidas; Abella Ferrer, Jaume; Quiñones Moreno, Eduardo; Cazorla Almeida, Francisco Javier
Universitat Politècnica de Catalunya. Departament d'Arquitectura de Computadors
Àrees temàtiques de la UPC::Informàtica::Hardware
Embedded computer systems
Fault-tolerant computing
Fault-tolerance
Probabilistic timing analysis
Testing
WCET
Sistemes incrustats (Informàtica)
Tolerància als errors (Informàtica)
Attribution-NonCommercial-NoDerivs 3.0 Spain
http://creativecommons.org/licenses/by-nc-nd/3.0/es/
info:eu-repo/semantics/publishedVersion
info:eu-repo/semantics/conferenceObject
Institute of Electrical and Electronics Engineers (IEEE)
         

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