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Abstract:
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Crystalline silicon Modules are formed by single silicon photovoltaic cells. Since each one of these cells individually contributes to the overall electric power of the panel, the failure of
one of them directly affects to its benefits and performance. To Minimize these negative effects, junction boxes with few bypass diodes are usually included in Photovoltaic Solar panels.
A still experimental way to built solar panels is to integrate bypass diodes in every single cell, which would increase PV Panels reliability.
This Work theoretically analyzes the reliability of solar panels in both cases, in terms of potential individual failures of its cells. |
