Para acceder a los documentos con el texto completo, por favor, siga el siguiente enlace: http://hdl.handle.net/2445/48189
dc.contributor | Universitat de Barcelona |
---|---|
dc.contributor.author | Oria, Roger |
dc.contributor.author | Otero Díaz, Jorge |
dc.contributor.author | González Claramonte, Laura |
dc.contributor.author | Botaya Turón, Luis |
dc.contributor.author | Carmona Flores, Manuel |
dc.contributor.author | Puig i Vidal, Manuel |
dc.date | 2013-11-29T09:04:09Z |
dc.date | 2013-11-29T09:04:09Z |
dc.date | 2013-04-29 |
dc.date | 2013-11-29T09:04:10Z |
dc.identifier.citation | 1424-8220 |
dc.identifier.citation | 625185 |
dc.identifier.uri | http://hdl.handle.net/2445/48189 |
dc.format | 14 p. |
dc.format | application/pdf |
dc.language.iso | eng |
dc.publisher | MDPI Publishing |
dc.relation | Reproducció del document publicat a: http://dx.doi.org/10.3390/s130607156 |
dc.relation | Sensors, 2013, vol. 13, p. 7156-7169 |
dc.relation | http://dx.doi.org/10.3390/s130607156 |
dc.rights | cc-by (c) Oria, Roger et al., 2013 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.rights | http://creativecommons.org/licenses/by/3.0/es |
dc.subject | Nanotecnologia |
dc.subject | Enginyeria |
dc.subject | Piezoelectricitat |
dc.subject | Detectors |
dc.subject | Microscòpia de força atòmica |
dc.subject | Nanotechnology |
dc.subject | Engineering |
dc.subject | Piezoelectricity |
dc.subject | Detectors |
dc.subject | Atomic force microscopy |
dc.title | Finite Element Analysis of Electrically Excited Quartz Tuning Fork Devices |
dc.type | info:eu-repo/semantics/article |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.description.abstract |