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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat |
dc.contributor.author | Manich Bou, Salvador |
dc.contributor.author | Strasser, Martin |
dc.date | 2013-09-05 |
dc.identifier.citation | Manich, S.; Strasser, M. A Highly time sensitive XOR gate for probe attempt detectors. "IEEE transactions on circuits and systems II: express briefs", 05 Setembre 2013. |
dc.identifier.citation | 1549-7747 |
dc.identifier.citation | 10.1109/TCSII.2013.2278126 |
dc.identifier.uri | http://hdl.handle.net/2117/20153 |
dc.language.iso | eng |
dc.relation | http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6589211 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
dc.subject | Metal oxide semiconductors |
dc.subject | CMOS integrated circuits logic gates phase detection smart cards Delays Detectors Logic gates Probes Standards Transistors |
dc.subject | Metall-òxid-semiconductors |
dc.title | A Highly time sensitive XOR gate for probe attempt detectors |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/article |
dc.description.abstract |